ECMP 486: Research in VLSI Systems
Reference Suggestions
Here's a list of good places to start when
looking for technical papers dealing with
VLSI Design Automation. Most are found
in Kelvin-Smith Library. (Journals are
in the reference section, and conference
proceedings are in the stacks.)
Journals:
- IEEE Transactions on VLSI Systems
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- IEEE Design and Test
- ACM Transactions on Design Automation of Electronic Systems (TODAES)
- Journal of Electronic Testing: Theory and Applications (JETTA)
Conferences:
- International Conference on Computer Aided Design (ICCAD)
- Design Automation Conference (DAC)
- European Design Automation Conference (EDAC)
- International Test Conference (ITC)
- European Test Conference (ETC)
- International Conference on Computer Design (ICCD)
- VLSI Test Symposium (VTS)
- ACM/SIGDA International Symposium on Field-Programmable Gate Arrays
Joan Carletta,
carletta@ces.cwru.edu